David Tax

2002
Juszczak P, Tax DMJ, Duin RPW. Feature scaling in support vector data description. In: Deprettere EF, Belloum A, Heijnsdijk JWJ, van der Stappen F Proc. ASCI 2002, 8th Annual Conf. of the Advanced School for Computing and Imaging. Proc. ASCI 2002, 8th Annual Conf. of the Advanced School for Computing and Imaging.; 2002:95-102.
Lai C, Tax DMJ, Duin RPW, Pekalska E, Paclik P. On combining one-class classifiers for image database retrieval. In: 3rd international workshop on multiple classifier systems. 3rd international workshop on multiple classifier systems. Cagliari, Italy; 2002:212-221.
Tax DMJ, Juszczak P. Kernel whitening for one-class classification. In: Lee S-W, Verri A International Workshop on Pattern Recognition with Support Vector Machines. International Workshop on Pattern Recognition with Support Vector Machines. Berlin; 2002:40-52.
Tax DMJ, Duin RPW. Using two-class classifiers for multiclass classification. In: International Conference on Pattern Recognition. International Conference on Pattern Recognition. Quebec, Canada; 2002.
2001
Tax DMJ. One-class classification. Delft University of Technology. 2001. Download: thesis.pdf (3.29 MB)
Tax DMJ, Duin RPW. Combining one-class classifiers. In: Proceedings of the second international workshop Multiple Combining Systems.Vol 2096. Proceedings of the second international workshop Multiple Combining Systems.; 2001:299-308.
Tax DMJ, Duin RPW. Outliers and data descriptions. In: Lagendijk RL, Heijnsdijk JWJ, Pimentel AD, Wilkinson MHF Proc. ASCI 2001, 7th Annual Conf. of the Advanced School for Computing and Imaging. Proc. ASCI 2001, 7th Annual Conf. of the Advanced School for Computing and Imaging.; 2001:234-241.
2000
Tax DMJ, Duin RPW. Data descriptions in subspaces. In: Proceedings of the International Conference on Pattern Recognition 2000.Vol 2. Proceedings of the International Conference on Pattern Recognition 2000.; 2000:672-675.
Duin RPW, Tax DMJ. Experiments with Classifier Combining Rules (invited paper). In: Kittler J, Roli F Multiple Classifier Systems (Proc. First International Workshop, MCS 2000, Cagliari, Italy, June 2000).Vol 1857. Multiple Classifier Systems (Proc. First International Workshop, MCS 2000, Cagliari, Italy, June 2000).; 2000:16-29.
Tax DMJ, Duin RPW, Messer K. Image Database Retrieval with Support Vector Data Descriptions. In: van Vliet LJ, Heijnsdijk JWJ, Kielman T, Knijnenburg PMW Proc. ASCI 2000, 6th Annual Conf. of the Advanced Schoolfor Computing and Imaging (Lommel, Belgium, June 14-16). Proc. ASCI 2000, 6th Annual Conf. of the Advanced Schoolfor Computing and Imaging (Lommel, Belgium, June 14-16).; 2000:134–140.
Tax DMJ, Duin RPW. Feature scaling in support vector data descriptions. In: Japkowicz N Learning from imbalanced datasets. Learning from imbalanced datasets.; 2000:25-30.
1999
1998
Tax DMJ, Duin RPW. Outlier detection using classifier instability. In: Amin A Advances in Pattern Recognition, Lecture notes in Computer Science.Vol 1451. Advances in Pattern Recognition, Lecture notes in Computer Science.; 1998.
de Ridder D, Tax DMJ, Duin RPW. An experimental comparison of one-class classification methods. In: Ter Haar Romeny BM, Epema DHJ, Tonino JFM, Wolters AA Proc. 4th Annual Conference of the Advanced School for Computing and Imaging (ASCI'98). Proc. 4th Annual Conference of the Advanced School for Computing and Imaging (ASCI'98). Delft, The Netherlands; 1998:213–218. Download: asci_98.pdf (574.08 KB)
1997
Tax DMJ, Duin RPW, van Breukelen M. Comparison between product and mean classifiercombination rules. In: Pudil P, Novovicova J, Grim J Proc. 1st International Workshop Statistical Techniquesin Pattern Recognition (Prague, CR, June 9-11). Proc. 1st International Workshop Statistical Techniquesin Pattern Recognition (Prague, CR, June 9-11).; 1997:165–170.
Tax DMJ, Duin RPW, van Breukelen M. Comparison between product and mean classifier combination rules. In: Pudil P, Novovicova J, Grim J Proc. 1st International Workshop Statistical Techniques in Pattern Recognition. Proc. 1st International Workshop Statistical Techniques in Pattern Recognition.; 1997:165-170.