Bob Duin

2004
2003
Lai C, Tax DMJ, Duin RPW, Pekalska E, Paclik P. Database retrieval: the use of combined dissimilaities. In: Vassiliades S, Florack LMJ, Heijnsdijk JWJ, van der Steen A Proc. ASCI 2003, 9th Annual Conf. of the Advanced School for Computing and Imaging. Proc. ASCI 2003, 9th Annual Conf. of the Advanced School for Computing and Imaging.; 2003:177-184.
Pekalska E, Tax DMJ, Duin RPW. One-Class LP Classifiers for Dissimilarity Representations. In: Becker S, Thrun S, Obermayer K Advances in Neural Information Processing Systems.Vol 15. Advances in Neural Information Processing Systems. Cambridge, MA, USA; 2003:761-768. Abstract  Download: pekalska_nips02.pdf (235.5 KB)
Juszczak P, Duin RPW. Selective sampling methods in one-class classification problems. In: 13th International Conference on Artificial Neural Networks. 13th International Conference on Artificial Neural Networks.; 2003:140-148. Download: ICANN_2003.pdf (439 KB)
de Ridder D, Kouropteva O, Okun O, Pietikainen M, Duin RPW. Supervised locally linear embedding. In: Kaynak O, Alpaydin E, Oja E, Xu L Artifical Neural Networks and Neural Information Processing (Proc. ICANN/ICONIP 2003). Artifical Neural Networks and Neural Information Processing (Proc. ICANN/ICONIP 2003). Berlin; 2003:333-341. Download: icann03.pdf (184.02 KB)
Juszczak P, Duin RPW. Uncertainty sampling for one-class classifiers. In: Proceedings of the ICML-2003 Workshop: Learning with Imbalanced Data Sets II. Proceedings of the ICML-2003 Workshop: Learning with Imbalanced Data Sets II.; 2003:81-88.
2002
Pekalska E, Skurichina M, Duin RPW. A Discussion on the Classifier Projection Space for Classifier Combining. In: Kittler J, Roli F Multiple Classifier Systems.Vol Lecture Notes in Computer Science. Multiple Classifier Systems.; 2002:37-148. Abstract  Download: pekalska_mcs_02_cps.pdf (225.53 KB)
de Ridder D, Duin RPW, Pekalska E. The economics of classification: error vs. complexity. In: Proc. 16th IAPR Int. Conference on Pattern Recognition (ICPR2002, Quebec, Canada, August 11-15 2002). Proc. 16th IAPR Int. Conference on Pattern Recognition (ICPR2002, Quebec, Canada, August 11-15 2002). Los Alamitos, CA; 2002:244-247. Download: icpr02.pdf (158.41 KB)
Juszczak P, Tax DMJ, Duin RPW. Feature scaling in support vector data description. In: Deprettere EF, Belloum A, Heijnsdijk JWJ, van der Stappen F Proc. ASCI 2002, 8th Annual Conf. of the Advanced School for Computing and Imaging. Proc. ASCI 2002, 8th Annual Conf. of the Advanced School for Computing and Imaging.; 2002:95-102.
de Ridder D, Duin RPW. Locally linear embedding for classification. Technical report PH-2002-01. 2002:1-15. Download: ph-2002-01.pdf (1.99 MB)
Duin RPW, Pekalska E. Possibilities of zero-error recognition by dissimilarity representations. In: Inesta JM, Mico L Pattern Recognition in Information Systems. Pattern Recognition in Information Systems. Allicante, Spain; 2002. Download: pekalska_pris_02_zero.pdf (146.83 KB)
Pekalska E, Duin RPW. Spatial representation of dissimilarity data via lower-complexity linear and nonlinear mappings. In: Caelli T, Amin A, Duin RPW, Kamel MS, de Ridder D International Workshop on SPR + SSPR.Vol Lecture Notes in Computer Science. International Workshop on SPR + SSPR.; 2002:470-478. Abstract  Download: pekalska_spr_02_spatrep.pdf (333.01 KB)
de Ridder D, Duin RPW, Kittler J. Texture description by independent components. In: Caelli T, Amin A, Duin RPW, Kamel MS, de Ridder D Proc. of the Workshops on Syntactical, Structural and Statistical Pattern Recognition. Proc. of the Workshops on Syntactical, Structural and Statistical Pattern Recognition. Berlin; 2002:587-596. Download: spr02.pdf (968.5 KB)
Lai C, Tax DMJ, Duin RPW, Pekalska E, Paclik P. On combining one-class classifiers for image database retrieval. In: 3rd international workshop on multiple classifier systems. 3rd international workshop on multiple classifier systems. Cagliari, Italy; 2002:212-221.
de Ridder D, Duin RPW. Principal components and curves for description of rodent behaviour. Measuring Behaviour (MB2002, Amsterdam, The Netherlands, August 27-30, 2002). 2002.
Pekalska E, Duin RPW. Prototype Selection for Finding Efficient Representations of Dissimilarity Data. In: Kasturi R, Laurendeau D, Suen C International Conference on Pattern Recognition.Vol 3. International Conference on Pattern Recognition. Quebec City, Canada; 2002:37-40.
Caelli T, Amin A, Duin RPW, Kamel MS, de Ridder D. Structural, Syntactical, and Statistical Pattern Recognition. Joint IAPR International Workshops SSPR 2002 and SPR 2002, Windsor, Ontario, Canada, August 6-9 2002. 2002.
Tax DMJ, Duin RPW. Using two-class classifiers for multiclass classification. In: International Conference on Pattern Recognition. International Conference on Pattern Recognition. Quebec, Canada; 2002.
2001
Pekalska E, Duin RPW. On Combining Dissimilarity Representations. In: Kittler J, Roli F Multiple Classifier Systems.Vol Lecture Notes in Computer Science. Multiple Classifier Systems.; 2001:359-368. Abstract  Download: pekalska_mcs_01_diss.pdf (152.52 KB)