Bob Duin

2005
Landgrebe TCW, Duin RPW. On Neyman-Pearson optimisation for multiclass classifiers. In: Nicolls F Sixteenth Annual Symposium of the Pattern Recognition Association of South Africa. Sixteenth Annual Symposium of the Pattern Recognition Association of South Africa.; 2005:165-170.
Paclik P, Tax DMJ, Verzakov SA, Duin RPW. Simplifying the model-based classifiers for multi-modal problems in classification of spectra. In: Nicolls F Proceedings of the Sixteenth Annual Symposium of the Pattern Recognition Association of South Africa. Proceedings of the Sixteenth Annual Symposium of the Pattern Recognition Association of South Africa.; 2005:33-38.
Pekalska E, Duin RPW. The use of dissimilarities for object recognition. In: EOS Conference on Industrial Image and Machine Vision. EOS Conference on Industrial Image and Machine Vision. Hannover, Germany; 2005:50-53.
2004
Verzakov SA, Paclik P, Duin RPW. Exploiting connectivity in spectral data: SVM band-shaving. In: van Wijk JJ, Heijnsdijk JWJ, Langendoen KG, Veltkamp R Proceedings of the 10th annual conference of the Advanced School for Computing and Imaging (ASCI). Proceedings of the 10th annual conference of the Advanced School for Computing and Imaging (ASCI). Delft, The Netherlands; 2004:129-133. Abstract  Download: sv_asci04.pdf (115.36 KB)
Landgrebe TCW, Paclik P, Tax DMJ, Verzakov SA, Duin RPW. Cost-based classifier evaluation for imbalanced problems. In: Fred ALN, Caelli T, Duin RPW, Campilho A, de Ridder D Proceedings of the 10th International Workshop on Structural and Syntactic Pattern Recognition and 5th International Workshop on Statistical Techniques in Pattern Recognition.Vol 3138. Proceedings of the 10th International Workshop on Structural and Syntactic Pattern Recognition and 5th International Workshop on Statistical Techniques in Pattern Recognition. Berlin; 2004:762-770.
Verzakov SA, Paclik P, Duin RPW. Feature shaving for spectroscopic data. In: Fred ALN, Caelli T, Duin RPW, Campilho A, de Ridder D Proceedings of the 10th International Workshop on Structural and Syntactic Pattern Recognition and 5th International Workshop on Statistical Techniques in Pattern Recognition.Vol 3138. Proceedings of the 10th International Workshop on Structural and Syntactic Pattern Recognition and 5th International Workshop on Statistical Techniques in Pattern Recognition. Berlin; 2004:1026-1033. Abstract  Download: sv_sspr04.pdf (204.41 KB)
Paclik P, Verzakov SA, Duin RPW. Multi-class extension of the GLDB feature extraction algorithm for spectral data. In: Kittler J, Petrou M, Nixon M Proceedings of the 17th International Conference on Pattern Recognition.Vol 4. Proceedings of the 17th International Conference on Pattern Recognition. Los Alamitos, CA; 2004:629-633.
Duin RPW, Pekalska E, Tax DMJ. The characterization of classification problems by classifier disagreements. In: Kittler J, Petrou M, Nixon M International Conference on Pattern Recognition.Vol 2. International Conference on Pattern Recognition. Cambridge, United Kingdom; 2004:140–143. Download: duin_icpr_04_classproblems.pdf (163.68 KB)
Pekalska E, Skurichina M, Duin RPW. Combining Dissimilarity Representations in One-class Classifier Problems. In: Roli F, Kittler J, Windeatt T Multiple Classifier Systems, Proceedings Fifth International Workshop MCS 2004. Multiple Classifier Systems, Proceedings Fifth International Workshop MCS 2004. Berlin; 2004:122-133. Abstract  Download: pekalska_mcs04.pdf (224.71 KB)
Juszczak P, Duin RPW. Combining one-class classifiers to classify missing data. In: Roli F, Kittler J, Windeatt T Multiple Classifier Systems, Proceedings Fifth International Workshop MCS 2004. Multiple Classifier Systems, Proceedings Fifth International Workshop MCS 2004. Berlin; 2004:92-101. Download: mcs_occ_004.pdf (250.57 KB)
Juszczak P, Duin RPW. Combining one-class classifiers to handle missing data. In: van Wijk JJ, Heijnsdijk JWJ, Langendoen KG, Veltkamp R Proc. ASCI 2004, 10th Annual Conf. of the Advanced School for Computing and Imaging. Proc. ASCI 2004, 10th Annual Conf. of the Advanced School for Computing and Imaging. Delft; 2004:75-82.
Loog M, van Ginneken B, Duin RPW. Dimensionality Reduction by Canonical Contextual Correlation Projections. In: Pajdla T, Matas J Computer Vision - ECCV 2004, 8th European Conference on Computer Vision. Computer Vision - ECCV 2004, 8th European Conference on Computer Vision. Berlin; 2004:562-573. Download: eccv_04_dimred.pdf (285 KB)
Duin RPW, Pekalska E, Paclik P, Tax DMJ. The dissimilarity representation, a basis for domain based pattern recognition?. In: Goldfarb L Pattern representation and the future of pattern recognition, a program for action (ICPR 2004 Workshop Proceedings Cambridge UK, 22 August 2004). Pattern representation and the future of pattern recognition, a program for action (ICPR 2004 Workshop Proceedings Cambridge UK, 22 August 2004). Fredericton, NB, Canada; 2004:43-56. Abstract  Download: duin_pekalska_representation_04.pdf (217.93 KB)
Loog M, Duin RPW. Linear Dimensionality Reduction via a Heteroscedastic Extension of LDA: The Chernoff Criterion. IEEE Transactions on Pattern Analysis and Machine Intelligence. 2004;PAMI:732-739. Download: pami_04_chernoff.pdf (506.33 KB)
Pekalska E, Duin RPW, Gunter S, Bunke H. On not making dissimilarities Euclidean. In: Fred ALN, Caelli T, Duin RPW, Campilho A, de Ridder D Structural, Syntactic, and Statistical Pattern Recognition. Structural, Syntactic, and Statistical Pattern Recognition. Berlin; 2004:1145-1154. Abstract  Download: pekalska_spr_04_not_making_euclidean.pdf (295.53 KB)
Jain A, Duin RPW. Pattern Recognition. In: Gregory RL The Oxford Companion to the Mind, Second Edition. The Oxford Companion to the Mind, Second Edition. Oxford, UK; 2004:698-703.
Skurichina M, Paclik P, Duin RPW, et al. Selection/Extraction of Spectral Regions for Autofluorescence Spectra Measured in the Oral Cavity. In: Fred ALN, Duin RPW, Campilho A, Caelli T, de Ridder D Structural, Syntactic, and Statistical Pattern Recognition. Structural, Syntactic, and Statistical Pattern Recognition. Berlin; 2004:1096-1104.
Juszczak P, Duin RPW. Selective Sampling Based on the Variation in Label Assignments. In: Kittler J, Petrou M, Nixon M Proceedings 17th International Conference on Pattern Recognition.Vol 3. Proceedings 17th International Conference on Pattern Recognition. Los Alamitos, CA; 2004:375-378. Download: ICPR_2004.pdf (439.1 KB)
Tax DMJ, Duin RPW. Support Vector Data Description. Machine Learning. 2004;54:45-66. Download: ML_SVDD_04.pdf (311.39 KB)