Bob Duin

2006
Pekalska E, Duin RPW. Learning with general proximity measures (invited paper). In: Pattern Recognition in Information Systems (Proc. PRIS2006, Paphos, Cyprus, May 2006). Pattern Recognition in Information Systems (Proc. PRIS2006, Paphos, Cyprus, May 2006).; 2006.
Tax DMJ, Duin RPW, Arzhaeva Y. Linear model combining by optimizing the Area under the {ROC} curve. In: Tang YY, Wang SP, Lorette G, Yeung DS, Yan H Proc. of the 18th Int. Conf. on Pattern Recognition (ICPR2006, Hong Kong, China, August 2006).Vol 4. Proc. of the 18th Int. Conf. on Pattern Recognition (ICPR2006, Hong Kong, China, August 2006). Los Alamitos; 2006:119-122.
Pekalska E, Harol A, Duin RPW, Spillman D, Bunke H. Non-Euclidean or non-metric measures can be informative. In: Yeung D-Y, Kwok JT, Fred ALN, Roli F, de Ridder D Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2006 (Hong Kong, China, August 2006).Vol 4109. Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2006 (Hong Kong, China, August 2006). Berlin; 2006:871-880.
Duin RPW, Pekalska E. Object representation, sample size and data complexity. In: Basu M, Ho TK Data Complexity in Pattern Recognition. Data Complexity in Pattern Recognition. London; 2006:25-47.
Tax DMJ, Juszczak P, Pekalska E, Duin RPW. Outlier detection using ball descriptions with adjustable metric. In: Yeung D-Y, Kwok JT, Fred ALN, Roli F, de Ridder D Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2006 (Hong Kong, China, August 2006).Vol 4109. Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2006 (Hong Kong, China, August 2006). Berlin; 2006:587-595.
Landgrebe TCW, Paclik P, Duin RPW, Bradley AP. Precision-recall operating characteristic ({P}-{ROC}) curves in imprecise environments. In: Tang YY, Wang SP, Lorette G, Yeung DS, Yan H Proc. of the 18th Int. Conf. on Pattern Recognition (ICPR2006, Hong Kong, China, August 2006).Vol 4. Proc. of the 18th Int. Conf. on Pattern Recognition (ICPR2006, Hong Kong, China, August 2006). Los Alamitos; 2006:123-126.
Verzakov SA, Paclik P, Duin RPW. Statistical pattern recognition approach to edge detection in multichannel images. In: Lelieveldt BPF, Haverkort B, de Laat CTAM, Heijnsdijk JWJ Proc. ASCI 2006, 12th Annual Conf. of the Advanced School for Computing and Imaging (Lommel, Belgium, June 14-16, 2006). Proc. ASCI 2006, 12th Annual Conf. of the Advanced School for Computing and Imaging (Lommel, Belgium, June 14-16, 2006). Delft; 2006:434-439.
Duin RPW, Pekalska E. Structural inference of sensor-based measurements. In: Yeung D-Y, Kwok JT, Fred ALN, Roli F, de Ridder D Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2006 (Hong Kong, China, August 2006).Vol 4109. Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2006 (Hong Kong, China, August 2006). Berlin; 2006:41-55.
Spillman D, Neuhaus M, Bunke H, Pekalska E, Duin RPW. Transforming Strings to Vector Spaces Using Prototype Selection. In: Yeung D-Y, Kwok JT, Fred ALN, Roli F, de Ridder D Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2006 (Hong Kong, China, August 2006).Vol 4109. Structural, Syntactic, and Statistical Pattern Recognition, Proc. SSSPR2006 (Hong Kong, China, August 2006). Berlin; 2006:287-296.
2005
Paclik P, Duin RPW. Designing multi-modal classifiers of spectra: a study on industrial sorting application Leitner R. Spectral Imaging (Proc. 2nd Int. Workshop of the Carinthian Tech Research AG, Villach, Austria, Sep 19-20). 2005:19-25.
Tax DMJ, Duin RPW. Characterizing one-class datasets. In: Proceedings of the Sixteenth Annual Symposium of the Pattern Recognition Association of South Africa. Proceedings of the Sixteenth Annual Symposium of the Pattern Recognition Association of South Africa.; 2005:21-26. Download: TaxDui2005.pdf (143.59 KB)
Skurichina M, Duin RPW. Combining feature subsets in feature selection. In: Oza NC, Polikar R, Kittler J, Roli F Multiple Classifier Systems.Vol 3541. Multiple Classifier Systems. Berlin; 2005:165-175.
Paclik P, Verzakov SA, Duin RPW. Co-occurrence Classifier: A Study on Classification of Inhomogeneous Rock Images. In: Kalviainen H, Parkinen J, Kaarna A Scandinavian Conference on Image Analysis, SCIA 2005. Scandinavian Conference on Image Analysis, SCIA 2005. Berlin; 2005:998–1008.
Juszczak P, Duin RPW. Learning from a test set. In: Kurzynski M, Puchala E, Wozniak M, Zolnierek A Computer Recognition Systems (Proc. of 4th Int. Conf. on Computer Recognition Systems CORES'05). Computer Recognition Systems (Proc. of 4th Int. Conf. on Computer Recognition Systems CORES'05). Berlin; 2005:203-210.
Harol A, Duin RPW. A New Model for Prototype Selection on Distance Data. In: Kröse BJA, Bos HJ, Hendriks EA, Heijnsdijk JWJ Proceedings of the 11th annual conference of the. Proceedings of the 11th annual conference of the.; 2005:137-144.
Duin RPW, Pekalska E. Open Issues in Pattern Recognition. In: Kurzynski M, Puchala E, Wozniak M, Zolnierek A Computer Recognition Systems (Proc. of 4th Int. Conf. on Computer Recognition Systems CORES'05). Computer Recognition Systems (Proc. of 4th Int. Conf. on Computer Recognition Systems CORES'05). Berlin; 2005:27-42. Abstract
Landgrebe TCW, Paclik P, Tax DMJ, Duin RPW. Optimising two-stage recognition systems. In: Oza NC, Polikar R, Kittler J, Roli F Sixth International Workshop on Multiple classifier systems. Sixth International Workshop on Multiple classifier systems. Berlin; 2005:206-215.
Pekalska E, Harol A, Lai C, Duin RPW. Pairwise Selection of Features and Prototypes. In: Computer Recognition Systems (Proc. of 4th Int. Conf. on Computer Recognition Systems CORES'05). Computer Recognition Systems (Proc. of 4th Int. Conf. on Computer Recognition Systems CORES'05). Berlin; 2005:271-278. Abstract
Duin RPW, Tax DMJ. Statistical Pattern Recognition. In: Chen CH, Wang PSP Handbook of Pattern Recognition and Computer Vision, 3rd ed. Handbook of Pattern Recognition and Computer Vision, 3rd ed. Singapore; 2005. Available at: http://www.worldscibooks.com/compsci/5711.html.
Verzakov SA, Duin RPW. The tangent kernel SVM for calibration-stable histogram discrimination. In: Kröse BJA, Bos HJ, Hendriks EA, Heijnsdijk JWJ Proceedings of the 11th annual conference of the. Proceedings of the 11th annual conference of the. Delft; 2005:73-80. Abstract  Download: verzakov_hist_asci.pdf (136.42 KB)