On Using Asymmetry Information for Classification in Extended Dissimilarity Spaces

TitleOn Using Asymmetry Information for Classification in Extended Dissimilarity Spaces
Publication TypeConference Proceedings
Year of Publication2012
AuthorsCalana, YP, García-Reyes, E, Duin, RPW, Orozco-Alzate, M
Refereed DesignationRefereed
EditorLeón, LA, Déniz, LG, Mejail, ME, Jacobo, J
Conference Name 17th Iberoamerican Congress in Pattern Recognition CIARP 2012
Series TitleProgress in Pattern Recognition, Image Analysis, Computer Vision, and Applications
VolumeLNCS 7441
Pagination503-510
Date Published2012
PublisherSpringer
ISBN978-3-642-33275-3